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IONTOFジャパン株式会社
Support
Products
M6
M6 Plus
M6 Hybrid SIMS
Qtac
SurfaceLab 7
TOF-SIMS & LEIS Technique
Applications
Semiconductor
Polymer
Paints and Coatings
Biomaterials
Pharmaceuticals
Glass
Paper
Metals
Catalysts
Disclaimer
IONTOFジャパン株式会社
Support
Products
SIMS Instrumentation
(Note: This information is provided on our international webpage)
M6
The latest, multi-purpose instrument guaranteeing superior performance in all application areas.
External link
M6 Product
M6 Plus
The M6 Plus platform combines high-end SIMS performance with in situ SPM capabilities.
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M6 Plus Product
M6 Hybrid SIMS
High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application.
External link
M6 Hybrid SIMS Product
Low Energy Ion Scattering
Qtac
Extremely surface sensitive instrument, providing unique and quantitative characterization of the top atomic layer.
External link
Qtac Product
Software
SurfaceLab 7
Versatile instrument operation, data acquisition and data analysis software package for all IONTOF instruments.
External link
SurfaceLab 7 software
How it works
TOF-SIMS and LEIS
Learn more about how advanced surface analysis works.
External link
TOF-SIMS / LEIS technique
Applications
Applications
(Note: This information is provided on our international webpage)
Semiconductor
The detection and quantification of trace metals is an important analytical task in the semiconductor industry.
External link
Semiconductor applications
Polymer
Discolourations on polymers are often caused by phase separation of the material's components.
External link
Polymer applications
Paints and Coatings
Coatings are of increasing importance for many industrial products for reasons of decoration as well as stability.
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Paints and Coatings applications
Biomaterials
The ability to image molecular compounds with high special resolution is very useful for biological applications.
External link
Biomaterials applications
Pharmaceuticals
SIMS can be used to determine the distribution of the different ingredients within pharmaceutical products.
External link
Pharmaceuticals applications
Glass
TOF-SIMS is a very powerful technique for the analysis of non-conductive materials e.g. glass.
External link
Glass applications
Paper
Paper surfaces are treated to obtain special surface properties. These modifications can be investigated.
External link
Paper applications
Metals
One major advantage of TOF-SIMS is the opportunity to combine high lateral and high depth resolution.
External link
Metals applications
Catalysts
For catalysis the characterization of the top atomic layer is essential. LEIS is the ideal technique for this application.
External link
Catalysts applications
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